4155B Agilent Semiconductor Parameter Analyzer
The Agilent HP 4155B Semiconductor Parameter Analyzer offers four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The HP 4155B is best suited for basic semiconductor applications with its non-kelvin connections, 10 V resolution, and 100 mA/100 Ohm measurement range.
- Product Introduction
Overview and Features
Product Overview
The Agilent HP 4155B Semiconductor Parameter Analyzer offers four built-in source/monitor units (SMUs), two voltage source units (VSUs), and two voltage monitor units (VMUs). The HP 4155B is best suited for basic semiconductor applications with its non-kelvin connections, 10 V resolution, and 100 mA/100 Ohm measurement range.
Other features and specifications of the Agilent Semiconductor Parameter Analyzer include:
● High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V
● Fully-automated I-V sweep measurements with dc or pulse mode
● Expandable up to 6 SMUs
● Synchronized stress/measure function
● Two high-voltage pulse generator units (±40 V)
● Time-domain measurement: 60µs–variable intervals, up to 10,001 points
● Easy to use: knob-sweep similar to curve tracer
● Automatic analysis functions
● Automation: built-in HP Instrument BASIC, trigger I/O capabilities
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